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Atomic-force microscopy
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#	Item
201	SCANNING MICROSCOPIES• Call for Papers Submit Abstracts by 13 April 2015 Add to Reading List Source URL: spie.org Language: English - Date: 2015-04-20 12:30:20 Microscopy SPIE Electron microscope Microscope Scanning probe microscopy Optical microscope Characterization Nanolithography Atomic force microscopy Science Scientific method Chemistry
202	Single-Pass Measurements in Atomic Force Microscopy Single-Pass Measurements in Atomic Force Microscopy: Kelvin Force Microscopy and Local Dielectric Studies NT-MDT Development Inc. 416 W. Warner Rd. Tempe AZ USA Add to Reading List Source URL: ntmdt.com Language: English - Date: 2013-10-09 06:55:25 Scientific method Atomic force microscopy AFM probe Microscopy Measuring instrument Kelvin probe force microscope Magnetic force microscope Scanning probe microscopy Science Chemistry
203	Chapter 6: Materials Protection and Surface Technology Unique Test Facilities Electron microscope (ESEM) with integrated atomic force microscope (AFM) Keywords Add to Reading List Source URL: www.bam.de Language: English - Date: 2015-02-04 09:11:40 Microscopy Scanning probe microscopy Nanotechnology Microscope Atomic force microscopy Environmental scanning electron microscope Scanning electron microscope Electron microscope Optical microscope Scientific method Science Electron microscopy
204	Pure environment NTEGRA Aura NTEGRA Aura Feel confident when everything is Add to Reading List Source URL: www.ntmdt.com Language: English - Date: 2015-02-26 06:24:56 Chemistry Atomic force microscopy Magnetic force microscope Microscopy Scanning capacitance microscopy Kelvin probe force microscope Conductive atomic force microscopy Vibrational analysis with scanning probe microscopy Photoconductive atomic force microscopy Scanning probe microscopy Science Scientific method
205	Pure environment NTEGRA Aura NTEGRA Aura Feel confident when everything is Add to Reading List Source URL: ntmdt.com Language: English - Date: 2015-02-26 06:24:56 Chemistry Atomic force microscopy Magnetic force microscope Microscopy Scanning capacitance microscopy Kelvin probe force microscope Conductive atomic force microscopy Vibrational analysis with scanning probe microscopy Photoconductive atomic force microscopy Scanning probe microscopy Science Scientific method
206	Surface and Interface Research Prof. Toshio Sakurai[removed]~ ) 【Staff Members】 Prof. Toshio Sakurai, Assoc. Prof. Yasunori Fujikawa, Res. Assoc. Jerzy T. Sadowski, Add to Reading List Source URL: www.review.imr.tohoku.ac.jp Language: English - Date: 2006-06-09 04:25:11 Acenes Pentacene Low-energy electron microscopy Surface reconstruction Gallium nitride Adsorption Atomic force microscopy Ultra-high vacuum Epitaxy Chemistry Scanning probe microscopy Intermolecular forces
207	High-Resolution Imaging in Different Atomic Force Microscopy Modes John Alexander and Sergei Magonov NT-MDT Development Inc. Tempe AZ USA (a) Add to Reading List Source URL: ntmdt.com Language: English - Date: 2015-02-26 01:00:01 Chemistry Intermolecular forces Atomic force microscopy Ficus Microscopy Spectroscopy Vibrational analysis with scanning probe microscopy Scanning probe microscopy Scientific method Science
208	Appl. Statist[removed], Part 5, pp. Bayesian change-point analysis for atomic force microscopy and soft material indentation Daniel Rudoy, Shelten G. Yuen, Robert D. Howe and Patrick J. Wolfe Add to Reading List Source URL: biorobotics.harvard.edu Language: English - Date: 2010-07-23 07:45:14 Linear regression Regression analysis Conjugate prior Normal distribution Statistics Econometrics Contact mechanics
209	Ian Wark Research Institute B: Book chapter Hayes, R. & Ralston, J[removed]), Application of atomic force microscopy in fundamental adhesion studies, in Adhesion promotion techniques, (K Mittal and A Pizzi Ed.), New York Add to Reading List Source URL: w3.unisa.edu.au Language: English - Date: 2011-11-22 21:50:48 Mineral processing Colloidal chemistry Condensed matter physics Soft matter Feldspathoid Colloid Ralston Cancrinite Gibbsite Chemistry Matter Crystallography
210	Application Note 088 High-Resolution Imaging in Different Atomic Force Microscopy Modes John Alexander and Sergei Magonov NT-MDT Development Inc. Tempe AZ USA Add to Reading List Source URL: www.ntmdt.com Language: English - Date: 2015-03-16 02:50:10 Chemistry Atomic force microscopy Microscopy Scanning tunneling microscope Microscope Vibrational analysis with scanning probe microscopy Magnetic force microscope Scanning probe microscopy Science Scientific method

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